Nowadays, power electronics play an important role in motor drives, utility interfaces based on renewable energy sources, power converters, power transmission, electric or hybrid vehicles and many other industrial applications. Moreover, the advancements in the power semiconductor technology with the emergence of wide band-gap devices have pushed the conversion efficiency of power electronics to very high levels, where however the reliability of power electronics is becoming more and more vital, and should draw more attention. In this context, the reliability assessment and improvement of power electronic systems should be addressed efficiently. Indeed, it is important to design for reliable power electronic systems to lower the risks of many failures during operation. This track session will focus on fundamental understanding of the physical reliability and mechanisms governing failure in a large variety of advanced semiconductor devices and systems, the electrical – physical failure analysis techniques, the methodologies and tools that could be used to reliably identify the root cause of failure in these devices.
The TPC is inviting papers related, but not limited to, the following areas:
Prospective authors should submit, by using the EDAS online platform, a paper of 6 pages maximum, including references and describing their original work, using the IEEE template. Publications Accepted papers will be published in the proceeding in the IEEE Xplore.